Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized Wafers

Sturm, James C.Miller, John C.2014-09-222026-09-292014-09-222026-09-2919926853http://arks.princeton.edu/ark:/88435/dsp01tx31qk736https://theses-dissertations.princeton.edu/handle/88435/dsp01tx31qk736Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized WafersPrinceton University Senior Theses