Publication: Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized Wafers
| datacite.rights | metadata.only | |
| dc.contributor.advisor | Sturm, James C. | en_US |
| dc.contributor.author | Miller, John C. | en_US |
| dc.date.accessioned | 2014-09-22T17:42:32Z | |
| dc.date.accessioned | 2026-09-29T22:33:40Z | |
| dc.date.available | 2014-09-22T17:42:32Z | |
| dc.date.available | 2026-09-29T22:33:40Z | |
| dc.date.issued | 1992 | en_US |
| dc.identifier.other | 6853 | en_US |
| dc.identifier.uri | http://arks.princeton.edu/ark:/88435/dsp01tx31qk736 | |
| dc.identifier.uri | https://theses-dissertations.princeton.edu/handle/88435/dsp01tx31qk736 | |
| dc.title | Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized Wafers | en_US |
| dc.type | Princeton University Senior Theses | en_US |
| dspace.entity.type | Publication | |
| pu.date.classyear | 1992 | en_US |
| pu.department | Electrical Engineering | en_US |
| pu.location | This thesis can be viewed in person at the <a href=http://mudd.princeton.edu>Mudd Manuscript Library</a>. To order a copy complete the <a href="http://rbsc.princeton.edu/senior-thesis-order-form" target="_blank">Senior Thesis Request Form</a>. For more information contact <a href=mailto:mudd@princeton.edu>mudd@princeton.edu</a>. | en_US |
| pu.projectgrantnumber | 690-2143 | en_US |
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